การจองคิวเครื่อง SEM

1. ให้ติดต่อเจ้าหน้าที่เพื่อคุยรายละเอียดทาง Line
https://lin.ee/7ZsQZ0x หรือโทร 022188109
2. จากนั้น create order เครื่องตามกำลังขยายที่ใช้ทาง sample-submission-system
3. เมื่อกรอกแล้วให้บอก Order number กับเจ้าหน้าที่ทาง Line https://lin.ee/7ZsQZ0x และส่งตัวอย่างมาที่ STREC Chula พร้อม Order number

 

Scanning Electron Microscope (SEM)

JEOL

Model : JEOL JSM-IT800SHL, Oxford ULTIM MAX 65

Scanning electron microscopy (SEM) is a powerful technique designed to examine a material’s surface. In SEM, an electron beam with acceleration voltages of up to 30 kV is focused on the specimen. The interactions between the electron beam and the specimen emit signals from the specimen, and detectors collect them. The recorded signals are combined to form an image [1].

Additional EDS is equipped for qualitative and quantitative, mapping and line scan elemental analysis. EDS limitations: no detection of elements below B, X-ray detection limit 1,000 -2,000 ppm (0.1 – 0.2 %wt.) depending on the element and samples must be no fluids.

The JSM-IT800 incorporates our “In-lens Schottky Plus field emission electron gun” for high resolution imaging to fast elemental mapping, and an innovative electron optical control system “Neo Engine”, as well as a system of seamless GUI “SEM Center”.
The JSM-IT800 allows for the replacement of the objective lens of the SEM as a module, offering different versions to satisfy various users requirements. FE-SEM; a super hybrid lens version (SHL/SHLs, two versions with different functions), which enables higher resolution observation and analysis.